Tien-Ko Wang  Ph.D.

Dean, Academic Affairs

Professor, Department of Engineering and System Science

Email: tkw@mx.nthu.edu.tw

Tel: +886-3-5719134

Fax: +886-3-5722713

Education

wPh.D. in Nuclear Engineering

Purdue University, USA (1981-1984)

wM.S. in Nuclear Engineering

 National Tsing Hua University, Taiwan, ROC (1975-1977)

wB.S. in Nuclear Engineering

 National Tsing Hua University, Taiwan, ROC (1971-1975)

 

Experience

wDean, Academic Affairs (2007- )

wDean, Commission of General Education (2007 Feb. - Jul. )

wSecretary General (2000-2002)

wDean, Student Affairs (1998-2000)

wChairman, Department of Engineering and System Science (1996-1998)

wDirector, Nuclear Science and Technology Department Center (1992-1996)

wHead, Reactor Division, Nuclear Science and Technology Department Center (1986-1989)

wHead, Health Physics Division, Nuclear Science and Technology Department Center (1985-1986)

wAssociate Professor (1985-1989)

wProfessor (1989- )

wMinatory Service (1977-1979)

wMechanical Engineer, Taiwan Power Company (1979-1981)

 

Research Interests

wNuclear Reactor Physics, Radiation Measurements, MOSFET Dielectric.

Publications 

A. Journal Papers

1. P.C. Hus and T.K. Wang, (1977) “ The Effect of Heating  Rate on TL Efficiency in the Linear Dose rang, “ Nucl. Sci. J., Vol.14, pp.28-32.

2. T.K. Wang, P.S. Wang, and P.C. Hsu, (1977) “Measurement of Reactor Thermal Neutron by LiF TLD, “ Nucl. Sci. J., Vol.14, pp.40-47.

3. T.K. Wang, P.S. Weng and P.C. Hsu, (1978) “Measurement of Reactor Thermal Neutrons with CaSO4: Dy TLD, “ J. Nucl. Sci. Tech., Vol.15, pp.72-75.

4. T.K. Wang, F.M. Clikeman, and K.O. Ott, (1986) “ Experimental and Conputational  Studies of the Gamma-ray Energy Deposition Rate in the Purdue Fast Breeder Blanket Facility, “ Nucl. Sci. Eng., Vol.93, pp.262-272.

5. T.K. Wang, Pin-Chieh Hsu, and Pao-Shan Weng, (1986) “ Application of TLD-200 Dosimeter on the Discrimination of a-, b-, and g-Radiation, “ Radiat. Prot. Dosimeter, “ Radiat. Prot. Dosim., Vol.16, No.3, pp.253-256.

6. Pin-Chieh Hsu and T.K. Wang, (1986) “ On the Annealing Procedure of CaF: Dy Dosimeter, “ Radiat. Prot. Dosim., Vol.16, No.3, pp.253-256.

7. T.K. Wang, Pin-Chien Hsu, and Pao-Shan Weng, (1987) “ Feasibilty Study of Using CaSO4: Dy Phoshpor for Simultaneous Esstimation of Exposure and  Its Time Elapsed, “ Radiat. Prrot. Dosim., Vol.18, No.3, pp.157-161.

8. Jinn-Jer Peir, Khalid A. AI-Hussan, and T.K. Wang (1987) “ Energy Dependent Cavity-Theory F-Factors for Gamma Heating Measurement using TLD, “ Nucl. Sci. J., Vol.24, No.4, pp.222-229.

9. Szu-Li Chang, Shi-Ping Teng, and T.K. Wang, (1987) “ Criticality Safety Study of Fuel, “ Nucl. Sci. J., (in Chinese). Vol.24, No.5, pp.286-292.

10.S.R. Chen, T.K. Wang and C.C. Chieng, (1987) “ Kuosheng Small Break LOCA Analysis Using MAAP2.0 and MAAP3.0 Codes, “ Trans. ANS., Vol.55, pp.439-440.

11.J.D. Lin, C.C. Chieng, and T.K. Wang, (1987) “ Analysis of Risk-Dominant Sequences by MAAP 3.0 for Kuosheng NPP, “ Trans. ANS., Vol.55, pp.440-441.

12.Y.W. Hsueh Liu, Y.H. Cheng, M.M. King and T.K. Wang, (1987) “ LMFBR Shieldding Benchmark Calculation Using a Mixed Group and Point Method, “ Trans. ANS., Vol.55, pp.549-550.

13.T.K. Wang, P.C. Hsu, and T.C. Chen, (1988) "A Personnel Dosimetry Using BG-7 card and TH-2 Badge for β and γ Disimetry," Rad. Prot. Dosim., Vol.22, No.1, pp.49-54.

14.T.K. Wang, S.L. Chang, and S.P. Teng, (1988) "Criticality Safety Evaluation for High Density Spend Fuel Storage Racks," Nucl. Tech., Vol.83, pp.5-15.

15.T.K. Wang, J.J. Peir, and P.C. Hsu, (1988) "Comparisons Between Calculated and Fast-Neutron/Gamma-Ray Energy-Doposition Rates in One-Dimensional Mixed Fast-Neutron/Gamma-Ray Field," Appl. Rad. Isot., vol.39, pp.157-167.  計畫編號:NSC75-0413-E007-01

16.T.K. Wang, P.C. Hsu and P.S. Weng, (1988) "Application of CaF2 : Tm (TLD-300) Dosimeter to the Discrimination Between Alpha, Beta and Gamma radiation," Appl. Rad. Isot., Vol.40, pp.329-335.

17.K.A. Al-Hussan, T.K. Wang and M.A. Obeid, (1989) "Comparisons of Gamma-Ray Heating Measurements Using Thermlluminescent Dorimeters with Calculations," Nucl. Tech., Vol.85, pp.238-244. 計畫編號:NSC75-0413-E007-01

18.C.C. Chen, T.K. Wang and S.C. Chiang, (1988) "Maanshan Small LOCA Analysis," Trans. ANS., Vol. 57, pp.174-146.

19.C.C. Chen, T.K. Wang and J.K. Hsueh, (1988) "Maanshan TpS1B Accident Analysis," Trans. ANS., Vol.55, pp.173-174.

20. T.K. Wang and H.K. Lu, (1989) "Comparisons Between Calculated and Measured Gamma-ray Energy-doposition Rates in Two-Dimensional Mixed Fast-Neutron/Gamma-Ray Fields," Appl. Radiat.Isot., vol.40, pp.595-606.  計畫編號:NSC76-0413-E007-10

21. T.K. Wang, (1990) "On the Use of TLD for Gamma-ray Dosimetry Evaluation in Mixed Fast-neutron/Gamma-ray Field," Radiat. Prot. Dosim., vol.33, pp.359-363.  計畫編號:NSC76-0413-E007-10

22. T.K. Wang and H.M. Liu, (1990) "Improvement on the Two-Phase-Flow Void Fraction Determination Using Monte Carlo Calcualtions," Prog. Nucl. Energy, Vol.24, pp.97-105.  計畫編號:NSC79-0413-E007-12

23. M. Lee I.J. Wu, and T.K. Wang, (1990) "Source Terms Quantifications of ATWS Sequences of Kuesheng Using MAAP 3.0B," Trans. Am. Nucl. Soc., Vol.61, pp.252-253.

24.H.M. Liu and T.K. Wang, (1990) "A Modified One-shot Photon-attenuation Method for Two-phase-flow Void-fraction Determination," Appl. Radiat. Isot., vol.42, pp.25-30.  計畫編號:NSC79-0413-E007-12

25.C.C. Chen and T.K. Wang, (1990) "Small-Break LOCA Analysis for Typical Westinghouse Three-Loop PWR with Large, Dry Containment," Nucl. Sci. J., Vol.27,pp.21-36.

26.T.K. Wang, J. Hsin and M. Lee, (1990) "A Study on Hydrogen Generation, Burning and Their Imapct on Fission Product Release Under a Postulated Large-Break LOCA," Nucl. Technol., Vol.91, pp.287-296.

27.T.K. Wang, D.C. Hsu and C.L. Tseng, (1990) "Feasibility Studies on Iterative Methods of Fuel-burnup Estimation Using Gamma-Ray spectrometry" Appl. Radiat. Isot., vol.41, pp.41-47.  計畫編號:NSC77-0413-E007-02

28.C.C. Cheng and T.K. Wang, (1990) "Station Blackout Analysis for a Typical PWR Plant," Nucl. Sci., vol.27, pp.105-122.

29.T.K. Wang, L.C. Tseng, (1990) "Fuel Burnup Determination Based on the Measurement of short-Lived Fission Product," Nucl. Technol., vol.91, pp.413-418.   計畫編號:NSC78-0413-E007-08

30.H.M. Liu and T.K. Wang, (1991) "A Modified Method for Two-phase flow void-fraction Determination Wsing Photon-attenuation Technique," Nucl. Instrum. Method, B69, pp.485-491.  計畫編號:NSC80-0413-E007-06

31.T.K. Wang, (1991) "A Review on the kO-Standardization Method of (n,γ) Neutron Activation Analysis," Nucl. Sci. J., vol. 28, pp.299-316.

32.H.M. Liu and T.K. Wang "A modified method for void-fraction determination in two-phare-flew systems emplaying photon-atternation teching", Nucl Instrum, Method, B69, pp485-491.

33.H.M. Liu and T.K. Wang, (1992) "A Mothod for correcting for the Effect of Fluctuating Voids in Radiomentric Diagnosis of Two-phase Flow," Appl. Radiat. Isot., vol.43, pp.761-775.  計畫編號:NSC80-0413-E007-06

34.T.K. Wang and H.M. Liu, (1992) "An Improved Method for Void-fraction Measurement Using Gamma-transmission Guage," Trans. Am. Nucl. Soci., vol. 65, 73.

35.L.J. Kang and T.K. Wang, (1993) "True Coincidence Correction of an HPGe Detecting System," Nucl. sci. J., vol.30, pp.247-258. 計畫編號:NSC82-0413-E007-79

36.T.K. Wang, L.J. Kang and R.Y. Chen, (1993) "A Personal Computer Based Program for HPGe Detector Absolute Peak Efficiency Calculation and Calibration," Appl. Radiat. Isot., Vol.44,pp.1147-1154.  計畫編號:NSC82-0413-E007-79

37.T.K. Wang, T.Y. Chen and L.J. Kang, (1993) "A Simplified Computer Program for HPGe Detector Absolute Peak Efficiency Calibration," Radiat. Phys.  計畫編號:NSC82-0413-E007-79

38.T.K. Wang and H.M. Liu, (1993) "An Improved Method for Void-fraction Measurement Using Gamma-transmission Guage," IEEE Trans. Nucl. Sci., vol.40, pp.669-674.  計畫編號:NSC82-0413-E007-08

39.T.K. Wang and H.W. Chang, (1994) "The Design of Tsing Hua Subcritical Facility," Appl. Radiat. Isot., vol.45, pp.835-844.

40.T.K. Wang and T.L. Lee, (1994) "Void-fraction Determination for Horizontal-Two-phase-flow Pipes Using Photon-attenuation Technique," Nucl. Instrum. Method. b., vol.93, pp.63-74.  計畫編號:NSC81-0413-E007-08

41.T.K. Wang, et al., (1995) "HPGe Delector Absolute-peak-efficiency Calibration by Using the ESOLAN Program", Appl. radiat. Isot., vol.46, pp.933-944.  計畫編號:NSC82-0413-E007-79

42.T.K. Wang, et al., (1996) “ HPGe Detector True-Coincidence Correction for Extended Cylinder and Marinelli-Beaker Sources ”, Nucl. Instrum. Meth. Vol.A376, pp.192-202.   計畫編號:NSC85-2212-E007-071

43.F.I. Chou, Y.Y. Wei, S.J. Jeang, T.K. Wang, J.J. Kai and C.W. Chi (1996) “ Biological Efficacy of B-Lopiodol for Neutron Capture Therapy as Measured in Human Kepatoma Cell Culture, “ Therapeutic Rasiology and Oncology, “ Vol.3, pp.215-220.

44.T.K. Wang, et al., (1997) “ HPGe Detector Efficiency Calibration for Ertended Cyclinder and Marinelli-beaker Source Using the ESOLAN Program, “ Appl. Rasdiat Isot., Vol.48, pp.83-95.    計畫編號:NSC86-2212-E007-029

45.F.I.Chou, Y.Y.Wei, S.J.Jeang, T.K.Wang and W.Y.Lui.(1997) “Encapsulation of boron in lipiodol for boron neutron capture therapy of hepatoma”, Advances in Neutron Capture Therapy, V.II, Chemistry and Biology, pp101-107.

46.J.J.Peir and T.K.Wang(1999) “TRIGA Full errichment verification gased on the measurement of short-lived fission products.” Appl. Radiat. Isot. 50, 1085-1096

47.T.K.Wang, I. M.Hou and C.L.Tseng(1999) “Well-type HPGe-detector absolute-peak-officiency calibration and true-coincidence correction,” Nucl. Instrum. Meth.A425, 504-515.     計畫編號:nsc87-2212-E007-051

48.M.Y. Wang, F. H. Ko, T. K. Wang, C. C. Yang and T. Y. Huang (1999) "Characterization and Modeling of Out-diffusion of Manganese and Zinc Impurities from  Deep Ultra-violet Photoresist" J. Electrochem. Soci. 146, 3455-3460.     計畫編號:NSC88-3011-B-007-009-NU

49.F. H. Ko, M. Y. Wang and T. K. Wang(1999), "Evaluation of Metal Migration and Determination of Trace Metals after Microwave Digestion for Lithographic Materials" Anal. Chem., 71, 5413. 計畫編號:NSC88-3011-B-007-009-NU

    50. F. H. Ko, L. T. Hsiao, C. T. Chou, M. Y. Wang and T. K. Wang (1999) “Evaluation of  Impution and Microwave Digestion Methods for Lithographic Materials,” Proc. SPIE, 3677, 907-917.

51.T. K. Wang and J. J. Peir (2000) "An Iterative Approach for TRIGA fuel Burnup Determination using Nondestructive Gamma-ray Spectrometry." Appl. Radiat. Isot. 52, 105-118.

52.T. K. Wang  et. al., (2001) "Characterization and Modeling of the metal diffusion from deep ultraviolet photoresist and silicon-based substrate" Appl. Radiat. Isot. 54, 811-820.  計畫編號:NSC88-3011-B-007-009-NU

53.Chin-Lung Cheng, Tien-Ko Wang, and Kuei-Shu Chang-Liao, (2003) “Chemical dry cleaning and pre-treatment on the electrical and reliability characteristic of high-k gate dielectrics in MOS device”, Proc. SPIE, 4999, 299-306.  計畫編號: NSC91-2212-E007-058

  54.  Chin-Lung Cheng, Kuei-Shu Chang-Liao, Ping-Liang Wang and Tien-Ko Wang, (2004), “Physical and Reliability Characteristics of Metal-Oxide-Semiconductor Devices with HfOxNy Gate Dielectrics on Different Surface-Oriented Substrates”, Jpn. J. Appl. Phys, Vol. 43(5A), pp.L599-L601. (SCI) 國科會計畫編號:NSC91-2212-E-007-075

  55.  Chin-Lung Cheng, Kuei-Shu Chang-Liao, Ching-Hung Huang, and Tien-Ko Wang,, (2004), “Effects of HfOxNy Gate-Dielectric Nitrogen Concentration on the Charge Trapping Properties of Metal-Oxide-Semiconductor Devices”, Jpn. J. Appl. Phys., Vol. 43(9A), pp.L1181-L1183. (SCI)

  56.  Chin-Lung Cheng, Kuei-Shu Chang-Liao, Ching-Hung Huang, and Tien-Ko Wang, (2004), “Effects of denuded zone of Si(111) surface on current conduction and charge trapping of HfOxNy gate dielectric in metal-oxide-semiconductor devices”, Applied Physics Letters, vol.85(20), pp.4723-4725. (SCI)

  57.  Hsiang-Yueh Lai, Kuei-Shu Chang-Liao, Tien-Ko Wang and Chao-Feng Sung, (2005), “Operation Characterization of Flash Memory with Silicon Nitride/Silicon Dioxide Stack Tunnel Dielectric”, Jpn. J. Appl. Phys., Vol. 44(14), pp.L435-L438. (SCI), NSC93-2212-E-007-026

  58.  Chin-Lung Cheng, Kuei-Shu Chang-Liao, Tien-Ko Wang, (2005), “Comparison on the effects of defects at Si(111) and Si(100) surface on electrical characteristics of MOS devices with HfOxNy gate dielectric”, Microelectronic Engineering, Vol. 80, pp.214-217. (SCI), NSC93-2215-E-007-014

  59.  Chin-Lung Cheng, Kuei-Shu Chang-Liao, Ching-Hung Huang, and Tien-Ko Wang, (2005), “Current-conduction and charge trapping properties due to bulk nitrogen in HfOxNy gate dielectric of metal-oxide-semiconductor devices”, Applied Physics Letters, Vol. 86(21), p.212902. (SCI), NSC93-2215-E-007-014

  60.  Chin-Lung Cheng, Chun-Yuan Lu, Kuei-Shu Chang-Liao, Ching-Hung Huang, Sheng-Hung Wang, and Tien-Ko Wang, (2006), Effects of Interstitial Oxygen Defects at HfOxNy/Si Interface on Electrical Characteristics of MOS Devices”, IEEE Trans. on Electron Devices, vol. 53(1), p.63-70. (SCI) NSC 94-NU-7-007-005.

  61.  Chin-Lung Cheng, Kuei-Shu Chang-Liao, Tzu-Chen Wang, Tien-Ko Wang, and Howard Chih-Hao Wang, (2006), “Thermal Stability of HfxTayN Metal Gate Electrodes for Advanced MOS Devices”, IEEE Electron Device Letters, Vol. 27(3), pp.148-150. (SCI) NSC 94-NU-7-007-005.

  62.  Y. T. Hsu , K. S. Chang-Liao, T. K. Wang , and C. T. Kuo, (2006), “Monitoring the moisture-related degradation of ethylene propylene rubber cable by electrical and SEM methods”, Polymer Degradation and Stability, vol. 91, pp.2357-2364. (SCI) NSC 94-NU-7-007-001

  63.  Chin-Lung Cheng, Kuei-Shu Chang-Liao, and Tien-Ko Wang, (2006), “Improved electrical and surface characteristics of metal-oxide- semiconductor device with gate hafnium oxynitride by chemical dry etching”, Solid-State Electronics, vol. 50, pp. 103-108. (SCI) NSC 94-NU-7-007-005

  64.  Hsiang-Yueh Lai, Kuei-Shu Chang-Liao, Tien-Ko Wang, Ping-Kun Wang, and Chin-Lung Cheng, (2006), “Performance improvement of flash memories with HfOxNy/SiO2 stack tunnel dielectrics”, Journal of Vacuum Science and Technology B, vol. 24, pp. 1683-1688. (SCI) NSC94-2215 E-007-024

  65.  Kuei-Shu Chang-Liao, Hsin-Chun Chang, B. S. Sahu, Tzu-Chen Wang, and Tien-Ko Wang, (2006), “Compatibility of HfxTayN Metal Gate Electrode with HfOxNy Gate Dielectric for Advanced CMOS Technology”, Microelectronic Engineering, vol.83(11-12), pp. 2516-2521.

  66.  Chin-Lung Cheng, Kuei-Shu Chang-Liao, Hsin-Chun Chang, and Tien-Ko Wang, (2006), “Electrical Characteristic Enhancement of Metal-Oxide- Semiconductor Devices by Incorporating HfON Buffer Layer at HfTaSiON/Si Interface”, Solid-State Electronics, vol. 50, pp.1024-1029. (SCI) NSC 94-NU-7-007-005

  67.  Chi-Chao Wang, Kuei-Shu Chang-Liao, Chun-Yuan Lu, and Tien-Ko Wang, (2006), ”Enhanced Band-to-Band Tunneling-Induced-Hot-Electron Injection in P-Channel Flash by Band-gap Offset Modification”, IEEE Electron Device Letters, Vol. 27(9), pp. 749-751. (SCI) NSC94-2215 E-007-024

  68.  Chia-Huai Ho, Kuei-Shu Chang-Liao,, Ya-Nan Huang, Tien-Ko Wang, and T. C. Lu, (2006), “ Performance and Reliability Improvement of Flash Device by A Novel Programming Method”, to be published in Microelectronic Reliability. (SCI) NSC94-2215 E-007-024

  69.  Chin-Lung Cheng, Kuei-Shu Chang-Liao, and Tien-Ko Wang, (2006), “Improvement on the electrical characteristics of HfOxNy-gated metal-oxide-semiconductor devices by high-temperature annealing”, Electrochemical and Solid-State Letters, vol. 9(11), p. F80-F82. (SCI) NSC94-2215 E-007-024

  70.  Chun-Yuan Lu, Kuei-Shu Chang-Liao, Ping-Hung Tsai, and Tien-Ko Wang, (2006), “Depth Profiling of Border Traps in MOSFET’s with High-k Gate Dielectric by Charge-Pumping Technique”, IEEE Electron Device Letters, Vol. 27(10), pp. 859-862. (SCI) NSC94-2215 E-007-024

  71.  Kuei-Shu Chang-Liao, Chin-Lung Cheng, Chun-Yuan Lu, B. S. Sahu, Tzu-Chen Wang, Tien-Ko Wang, S.F. Huang, W.F. Tsai, and C.F. Ai , (2007), “Reliability and Thermal Stability of Clustered Vertical Furnace Grown SiO2 with HfxTayN Metal Gate for Advanced MOS Device Application”, IEEE Trans. on Electron Devices, vol. 54(2), pp. 233-240. (SCI) NSC 94-NU-7-007-005.

  72.  Chia-Huai Ho, Kuei-Shu Chang-Liao, Ya-Nan Huang, Tien-Ko Wang, and T. C. Lu, 2007, “Performance and Reliability Improvement of Flash Device by A Novel Programming Method”, Microelectronics Reliability, Vol.47, pp.967-971. (SCI:0.815) NSC94-2215 E-007-024

  73.  Chun-Yuan Lu, Kuei-Shu Chang-Liao, Chun-Chang Lu, Ping-Hung Tsai, Yin Yin Kyi, and Tien-Ko Wang , 2008, “Investigation of Voltage-Swing Effect and Trap Generation in High-k Gate Dielectric of MOS Devices by Charge-Pumping Measurement”, Microelectronic Engineering, Vol.85, pp.20-26. (SCI:1.347)

  74.  Chun-Yuan Lu, Kuei-Shu Chang-Liao, Chun-Chang Lu, Ping-Hung Tsai, and Tien-Ko Wang, 2007, “Detection of Border Trap Density and Energy Distribution along the Gate Dielectric Bulk of High-k Gated MOS Devices”, IEEE Electron Device Letters , vol. 28(5), p.432-435. (SCI:2.538).

  75.  Chang-Ta Yang, Kuei-Shu Chang-Liao, Hsin-Chun Chang, B. S. Sahu, Tzu-Chen Wang, Tien-Ko Wang, and Wen-Fa Wu , 2007, “Integration of HfxTayN metal gate with SiO2 and HfOxNy gate dielectrics for MOS device applications”, Microelectronic Engineering, Vol.84, pp.2916-2920. (SCI:1.347)

  76.  Ping-Hung Tsai, Kuei-Shu Chang-Liao, Tzu-Cheng Wang, Tien-Ko Wang, Chuen-Horng Tsai, and Chin-Lung Cheng , 2007, “Effect of nitrogen content in HfxTayN metal gate on work function and thermal stability of advanced metal-oxide-semiconductor devices”, Applied Physics Letters, vol. 90, p.132101. (SCI:4.308)

  77.  Y. T. Hsu, K. S. Chang-Liao, T. K. Wang, and C. T. Kuo, 2007, “Correlation between mechanical and electrical properties for assessing the degradation of ethylene propylene rubber cables used in nuclear power plants”, Polymer Degradation and Stability, vol. 92, pp. 1297-1303.(SCI: 2.174)

  78.  Ping-Hung Tsai, Kuei-Shu Chang-Liao, H.Y. Kao, T.K. Wang, S. F. Huang, W. F. Tsai, and C. F. Ai, 2007, “Improved electrical characteristics of high-k gated MOS devices by nitrogen incorporation with plasma immersion ion implantation (PIII)”, Microelectronic Engineering, vol.84, pp.2192-2195. (SCI:1.347)

  79.  Ping-Hung Tsai, Kuei-Shu Chang-Liao, Hsin-Chun Chang, Tien-Ko Wang, Wen-Fa Wu, 2007, “Electrical and material property enhancement in HfTaSiON-gated MOS devices by tuning Hf composition ”, Microelectronic Engineering, vol.84, pp.1902-1905. (SCI:1.347)

  80.  Robin C.J. Wang, K.S. Chang-Liao, T.K. Wang, C.C. Lee, J.H. Lin, A.S. Oates, S.C. Lee, and Kenneth Wu, 2007, “Resistance Characterization of Cu Stress-Induced Void Migration at Narrow Metal Finger Connected with Wide Lead”, Thin Solid Films, vol. 516, pp.449-453.(SCI:1.666)

  81.  Ping-Hung Tsai, Kuei-Shu Chang-Liao, Chu-Yung Liu, Tien-Ko Wang, P. J. Tzeng, C. H. Lin, L. S. Lee, and M.-J. Tsai, 2008, “Novel SONOS-Type Nonvolatile Memory Device with optimal Al doping in HfAlO Charge-Trapping Layer”, IEEE Electron Device Letters, vol. 29(3), p.265-268. (SCI:2.538).

  82.  Chung-Hao Fu, Po-Yen Chien, Kuei-Shu Chang-Liao, Tien-Ko Wang, and Wen-Fa Wu, 2008, “Characteristics and Thermal Stability of MOS devices with MoN/TiN and TiN/MoN metal gate stacks”, Solid-State Electronics, vol.52, pp. 1512-1517.

  83.  Ping-Hung Tsai, Kuei-Shu Chang-Liao, Tai-Yu Wu, Tien-Ko Wang, Pei-Jer Tzeng, Cha-Hsin Lin, Lung-Sheng Lee and Ming-Jin Tsai, 2008, “Novel SONOS-type nonvolatile memory device with stacked tunneling and charge-trapping layers”, Solid-State Electronics, vol.52, pp. 1573-1577.

  84.  Chang-Ta Yang, Kuei-Shu Chang-Liao, Hsin-Chun Chang, Chung-Hao Fu, Tien-Ko Wang1, and Wen-Fa Wu, 2008, “Electrical Characteristics and Thermal Stability of HfxTaySizN Metal Gate Electrode for Advanced MOS Devices”, to be published in IEEE Trans. on Electron Devices. (SCI:2.036)

 

B. Conference Papers

1.          Pin-Chieh Hsu, Pao-Shan Weng and T.K. Wang, June (1986) “ Energy Dtermination of Different LET Radiaation Using CaF: TmTLD, “ 21st Annual Meeting of Japan Health Physics Society, Tokyo.

2.          Pas-Shan Weng, The-Chao Chen and T.K. Wang, Nov. (1986) “ Observation of Personnel Exposures in a Nuclear Science and Technology Oriented University, “ First Asian Symposium on Research Reactors, Tokyo, ASRR-1.

3.          T.K. Wang, Bau-Shei Pei ans Ying-Min Hsu, Nov. (1986) “ Estimation of Nuclear Power Plant Accient Consequences, “ Modern Engineering and Technology Seminar, METS, Taipei, pp.719-738.

4.          Pao-Shan Weng, The-Chao Chen ans T.K. Wang, March (1987) “ Personnel Dose Profile Toward Industrilaziation, “ Proc. Int. Conf. On Radiation Dosimetry and Safety, Taipei, pp.35-45.

5.          Jin-Jer Peir, Pin-Chieh Hsu, and T.K. Wang, March (1987) “ A Study on the CaF: Mn TLD Annealing Procedure, “ Proc. Int. Conf. On Rasiation Dosismetry and Safety, Taipei, pp.549-556.

6.          Pin-Chieh Hsu, T.K. Wang, and Pao-Shan Weng, Mar. (1987) “ A Study on the Thermoluminescent Characteristics of Some Self-made CaSO: Dy Phosphors, “ Proc. Int. Conf. On Radiation Dosimetry and Safety, Taipei, pp.189-200.

7.          T.K. Wang, B.S. Pei, T.T. Huang and C.T. Lin (1987) “ The Evaluation of the Consequences Post Severe Core Damage Accidents, “ Proc. Annual ROCAEC Nucl. Safety Conf., Taipei. (in Chinese) 1-5, pp.1-17.

8.          S.L. Chang, S.P. Teng, and T.K. Wang, C.T. Yang and S.J. Lin, (1987) “ Development of Computer Code Package for Evaluation of Nuclear Criticality Safety, “ Proc. Annual ROCAEC Nucl. Safety Conf., Taipei, (in Chinese) 1-7, pp.1-17.

9.          T.K. Wang, S.L. Chang, and S.P. Teng, (1987) “ Criticity Studies on a High Density Spent Fuel Storage Pool, “ Proc. Int. Conf. Nucl. Fuel Reproc. and Waste Management, RECOD87, Paris. V., 1343-1346.

10.      T.K. Wang, P.S. Pei, M.J. Lin, H.M. Liu and C.M. Lo, Sept. (1988) "Calculations on Severe Accident Consequences," Proc. Annual ROCAEC Nuclear Safety conf., taipei. (in Chinese) pp.1-12.

11.      T.K. Wang, D.L. Tseng, H.P. Chou and M.S. Ouyang, Sept. (1988) "Operational and Research Activities of Tsing Open Pool Reactor," 10th european TRIGA Users Conf., vienna.

12.      T.K. Wang, D.C. Hsu, C.L. Tseng and T.F. Law, Dec. (1988) "Iterative Approach to MTR Fuel burnup Determination using NDA," Proc. Int. symp. on Research Reactors, ISRR-1988, Taipei. pp.337-350.

13.      T.K. Wang W.W.H. Liu, H.M. Liu and I.J. Wu, (1989) "Determination of THOR Void Reactivity," Proc. Annual ROCAEC Nuclear Safety Conf., Taipei (in Chinese) 1-22, pp.1-13.

14.      T.K. Wang, July (1989) "MAAP Code and its Applications," Proc. Workshop on Severe Accident Management of LWRs, Taipei.

15.      G.B. West and T.K. Wang, Oct. (1989) "THOR TRIGA Fuel conversion Power Uprating and use of computer-Based Control System," Proc. Int. Sym. on Research Reactor Safety, Operation and Modification, Chalk River, Canada.

16.      T.K. WANG, Nov. (1989) "On the Use of TLDs for Gamma-ray Dosimetry Evaluation in Mixed Fast-Neutron/Gamma-ray Field," Proc. 9th Int. Conf. on Solid State Dosimetry, Vienna.

17.      T.K. Wang and H.M. Liu, Sept. (1990) "Improvement on the Two-phase-flow Void Fraction Detemination Using Monte Carlo Calculations," Int. Conf. Monte Carlo Meth. for Neutron and Photon Trans. Calculations, Budapest. 計畫編號:NSC79-0413-E007-12

18.      T.K. Wang, April "Criticality Analysis for High-Density Spent-fullStorage Racks," The 3rd Int. Conf. Nucl. Fuel Reproc. and Waste Mgmt., Sendai.

19.      H.M. Liu and T.K. Wang, "A Modified Method for Two-phase-flow Voidws-Fraction Determination Using Photon-Attenuation Technique," 5th Int. Sym. Raiat. Phys., Dubrovnik.  計畫編號:NSC80-0413-E007-06

20.      T.K. Wang, L.J. Kang and T.Y. Chen, Sept. "A PC-Based Program for HPGe Detector Calculation and Calibration," International k. -users workshop-Gent, Belgium.  計畫編號:NSC82-0413-E007-079

21.      T.K. Wang, L.J. Kang and T.K. Chen, Sept. "A Simplified Computer program for HPGe Detector Absolute Peak Efficiency Calibration," 8th Int. Meeting on Radiation Porcessing, Beijing. 計畫編號:NSC81-0413-E007-079

22.      T.K. Wang, L.J. Kang and T.K. Chen, Sept. (1992) "A Simplified Computer program for HPGe Detector Absolute Peak Efficiency Calibration," 8th Int. Meeting on Radiation Porcessing, Beijing.  計畫編號:NSC81-0413-E007-079

23.      T.K. Wang, L.J. Kang and T.Y. Chen, Sept. (1992) "A PC-Based Program for HPGe Detector Calcualtion and Calibration," International K-Users Workshop-Gent, Beligium.  計畫編號:NSC82-0413-E007-079

  24.      T.K. Wang and H.M. Liu, Oct. "A Improved Method for void-Fraction Measurement Using Gamma-Transmission Guage," IEEE Nuclear Science Symposiu, Orlando.  計畫編號:NSC82-0413-E007-079

  25.      T.K. Wang and H.M. Liu, Oct. (1992) "A Improved Method for Void-Fraction Measurement Using Gamma-Transmission Guage," IEEE Nuclear Science Symposium, Orlando.  計畫編號:NSC82-0413-E007-079

  26.      T.K. Wang, Jul. (1994) "HPGe Detector Absolute-Peak-Efficiency Calibration by Using the ESOLAN Program," 6th Int. conf. Radiat. Phys., Rabat.  計畫編號:NSC83-0413-E007-086

  27.      F.I. Chou, T.K. Wang and T.C. Kai (1996) “ Encapsrelation of Boron Drugs in Lipiodol to Enchance the Intracelllular Update by Human Hepatoma Cells with the Use of BNCT, ” 7th Int. Sym Neutron Capture Therapy for Cancer, Zurich.

  28.      F. H. Ko, L. T. Hsiao, C. T. Chou, M. Y. Wang, T. K. Wang (1999) "Eualuation of Impurity Migration and Microwave Digestion Methods for Lithographic Materials," Proc. SPIE 3678-44, Santa Clara, CA.  計畫編號:NSC88-3011-B-007-009-NU

  29.      C.C. Lin, T.K. Wang and K.S. Chang-Liao (2000) “Preparation of High-Quality Silicon Nitride Dielectric by LPCVD with Two-step RTP Annealing,” The 7th Sym. On Nano Device Technology, NCTU, Taiwan.

  30.      Y.P. Lin, T.K. Wang and K.S. Chang-Liao (2000) “Suppression of Copper Penetration by Using SiO2 and Amorphous Si,” The 7th Sym. On Nano Device Technology, NCTU, Taiwan.

  31.      (invited talk) Chin-Lung Cheng, Tien-Ko Wang, and Kuei-Shu Chang-Liao, 2003, “Chemical dry cleaning and pre-treatment on the electrical and reliability characteristic of high-k gate dielectrics in MOS device”, SPIE Photonic West Symposium, Abstract 4999-36, San Jose, U.S.A.

 32.      (invited talk) K.S. Chang-Liao, J.Y. Pan, C.L. Cheng, and T.K. Wang, 2003, “Electrical properties and reliability of silicon nitride gate dielectric formed by various processed and annealing treatments”, The 203th Meeting of the Electrochemical Society, Abstract no. 478, Paris, France.

  33.      Chin-Lung Cheng, Kuei-Shu Chang-Liao, and Tien-Ko Wang, 2003, “Improved Interface Properties of MOS Device with Gate Hafnium Oxynitride by Chemical Dry Cleaning”, The 34th IEEE Semiconductor Interface Specialists Conference (SISC), Proceedings, P-2, Washington DC, U.S.A.

  34.      Chin-Lung Cheng, Kuei-Shu Chang-Liao, Ping-Liang Wang, and Tien-Ko Wang, 2003, “Electrical and Reliability Characteristics of MOS Device with HfOxNy Gate Dielectric Sputtered by Different Flows in Nitrogen Ambient”, Electron Devices and Materials Symposium proceedings, p. 243, R.O.C

  35.      Chin-Lung Cheng, Kuei-Shu Chang-Liao, and Tien-Ko Wang, 2004, “Improvement of Electrical and Interface Property in MOS Device with Gate Hafnium Oxynitride by Plasma Dry Cleaning”, The 205th Meeting of the Electrochemical Society, Abstract no. 142, San Antonio, U.S.A.

  36.      Chin-Lung Cheng, Kuei-Shu Chang-Liao, and Tien-Ko Wang, 2004, “Electrical Charaterization in HfOxNy Gate Dielectric with Different Nitrogen Concentration Profiles Formed by Rapid Thermal Annealing”, The 205th Meeting of the Electrochemical Society, Abstract no. 271, San Antonio, U.S.A.

  37.      Chin-Lung Cheng, Kuei-Shu Chang-Liao, Ching-Hung Huang, and Tien-Ko Wang, 2004, “Effects of the Bulk Nitrogen in HfOxNy High-k Gate Dielectric on Charge Trapping Properties of MOS Devices”, Taiwan International Conference on Nano Science and Technology Extended Abstract Book, p.100, Hsinchu, Taiwan.

  38.      H.Y. Lai, K.S. Chang-Liao, T.K. Wang, and Z.F. Song, 2004, “Improved Performance of Flash Memory by Silicon Nitride/Silicon Dioxide Stack Tunnel Dielectric”, 11th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits, proceedings p. 243, Hsinchu, Taiwan.

  39.      (invited) Kuei-Shu Chang-Liao, Chun-Yuan Lu, Chin-Lung Cheng, and Tien-Ko Wang, 2004, “Process Techniques and Electrical Characterization for High-k (HfOxNy) Gate Dielectric in MOS Devices”, The 7th International Conference on Solid-State and Integrated-Circuit Technology, Beijing, China.

  40.      Kuei-Shu Chang-Liao, Chin-Lung Cheng, and Tien-Ko Wang, 2004, “ Effects of Bulk Nitrogen in HfOxNy Gate Dielectric on Current Conduction and Charge Trapping Properties of MOS Devices”, The 35th IEEE Semiconductor Interface Specialists Conference (SISC), Proceedings, P-21, San Diego, U.S.A.

  41.      Chin-Lung Cheng, Kuei-Shu Chang-Liao, Ching-Hung Huang and Tien-Ko Wang, 2004, “Effects of Nitrogen Profiles in HfOxNy Gate Dielectric on Current Conduction and Charge Trapping Properties of MOS Devices”, 2004 International Electron Devices and Materials Symposium proceedings, p. 315, Hsinchu, R.O.C.

  42.      Chin-Lung Cheng, Kuei-Shu Chang-Liao and Tien-Ko Wang, 2005, “ Effects of Interstitial Oxygen Defects at HfOxNy/Si(111) Interface on Current Conduction and Charge Trapping of MOS Devices”, IEEE VLSI-TSA Proceedings, p.134, Hsinchu, Taiwan ROC.

  43.      K.-S. Chang-Liao, C.-L. Cheng and T.-K. Wang, 2005, ”Effects of defects at HfOxNy/Si interface on electrical characteristics of MOS devices with (100)- and (111)-surface-oriented Si substrate”, Proceedings of the 14th bi-annual conference on Insulating Films on Semiconductors (INFOS 2005), p.214, Leuven, Belgium.

  44.      Chin-Lung Cheng, Kuei-Shu Chang-Liao, Tzu-Chen Wang, Tien-Ko Wang, and Howard Chih-Hao Wang, 2005, “The Composition Effects of Hafnium (Hf) and Tantalum (Ta) in HfxTayN Metal Gate on the Thermal Stability of MOS Devices”, The 36th IEEE Semiconductor Interface Specialists Conference (SISC) Proceedings, p.29, Washington DC, U.S.A.

  45.       Chin-Lung Cheng, Kuei-Shu Chang-Liao, Hsin-Chun Chang and Tien-Ko Wang, 2005, “Electrical Characteristic Enhancement of HfTaSiON-Gated Metal-Oxide -Semiconductor Devices Using HfON Buffer Layer”, 2005 International Semiconductor Device Research Symposium (ISDRS), FP5-05, Bethesda, MD, USA

  46.      Kuei-Shu Chang-Liao, Tzu-Chen Wang, Tien-Ko Wang, and Chin-Lung Cheng, 2006, “Integration of HfxTayN Metal Gate Electrode with High-k Gate Dielectric in MOS Devices”, The 209th Meeting of the Electrochemical Society, Abstract no. 380, Denver, U.S.A.

  47.      Kuei-Shu Chang-Liao, Ping-Hung Tsai, H.Y. Kao, T.K. Wang, S.F. Huang, W.F. Tsai, and C.F. Ai, 2006, “Electrical characteristic improvement of high-k gated MOS device by nitridation treatment using plasma immersion ion implantation (PIII)”, 2006 International Conference on Solid State Devices and Materials (SSDM 2006), P14, Yokohama, Japan.

  48.      Kuei-Shu Chang-Liao, Chun-Yuan Lu, Chun-Chang Lu, Ping-Hung Tsai, and Tien-Ko Wang, 2006, “Profiling Border Trap Density and Energy Distribution along Gate Dielectric Bulk of High-k Gated MOS Devices”, The 3rd International Symposium on Advanced Gate Stack Technology, p.94, Austin, U.S.A.

  49.      P.-H. Tsai, K.-S. Chang-Liao, C.-Y. Liu, T.-K. Wang, P. J. Tzeng, L.S. Lee, and M.-J. Tsai, 2006, “Improved Performance of Nonvolatile Memory Device with Band Offset Tuning in HfAlO Charge-Trapping Layer”, to be presented at The 37th IEEE Semiconductor Interface Specialists Conference (SISC), San Diego, U.S.A.

  50.      Kuei-Shu Chang-Liao, Chun-Yuan Lu, Chun-Chang Lu, Ping-Hung Tsai, and Tien-Ko Wang, 2006, “Profiling Border Trap Density and Energy Distribution along the Gate Dielectric Bulk of High-k Gated MOS Devices”, to be presented at The 37th IEEE Semiconductor Interface Specialists Conference (SISC), San Diego, U.S.A.

C. Books

1. 李敏、王天戈,「核能知識彙編」,漢光文化事業股份有限公司 (1991)

2. 王天戈,「原子、核能、輻射」,中山學術基金會,中山文庫,台灣書店印行(1997)